Evaluation of lattice motion in CdTe single crystal using in-air tabletop time-resolved X-ray diffractometer
نویسندگان
چکیده
A bulk single crystal sample of cadmium telluride (CdTe) was irradiated with a ~3 mJ/cm infrared femtosecond laser and analyzed with time-resolved X-ray diffraction (XRD) performed on an in-air tabletop designed for an extremely short pulsed X-ray source. The integrated intensity of Kα XRD lines from the CdTe (111) plane was decreased by 4%–5% in the time scale of ~200 ps. The changes in integrated intensity of the XRD line were induced by the thermal effect of the CdTe lattice propagating at the acoustic velocity in the crystal.
منابع مشابه
تعیین ساختار تک بلور های CdTe با میکروسکوپ الکترونی تراگلیسی
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